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Commit 26e1becc authored by Stephen Warren's avatar Stephen Warren Committed by Simon Glass
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test/dm: clear unit test failure count each run


The ut command prints a test failure count each time it is executed.
This is stored in a global variable which is never reset. Consequently,
the printed failure count accumulates across runs. Fix this by clearing
the counter each time "ut" is invoked.

Signed-off-by: default avatarStephen Warren <swarren@nvidia.com>
Acked-by: default avatarSimon Glass <sjg@chromium.org>
parent d20e5e97
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......@@ -81,6 +81,8 @@ static int dm_test_main(const char *test_name)
struct unit_test *test;
int run_count;
uts->fail_count = 0;
/*
* If we have no device tree, or it only has a root node, then these
* tests clearly aren't going to work...
......
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